Invention Grant
- Patent Title: 3D integration structure and method using bonded metal planes
- Patent Title (中): 3D集成结构和使用粘合金属平面的方法
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Application No.: US12465839Application Date: 2009-05-14
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Publication No.: US07939369B2Publication Date: 2011-05-10
- Inventor: Mukta G. Farooq , Subramanian S. Iyer
- Applicant: Mukta G. Farooq , Subramanian S. Iyer
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ira D. Blecker; Jennifer R. Davis
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/48 ; H01L21/50

Abstract:
A method of making 3D integrated circuits and a 3D integrated circuit structure. There is a first semiconductor structure joined to a second semiconductor structure. Each semiconductor structure includes a semiconductor wafer, a front end of the line (FEOL) wiring on the semiconductor wafer, a back end of the line (BEOL) wiring on the FEOL wiring, an insulator layer on the BEOL wiring and a metallic layer on the insulator layer. The first semiconductor structure is aligned with the second semiconductor structure such that the metallic layers of each of the semiconductor structures face each other. The metallic layers of each of the semiconductor structures are in contact with and bonded to each other by a metal to metal bond wherein the bonded metallic layers form an electrically isolated layer.
Public/Granted literature
- US20100289144A1 3D INTEGRATION STRUCTURE AND METHOD USING BONDED METAL PLANES Public/Granted day:2010-11-18
Information query
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