Invention Grant
US07930123B2 Method, apparatus, and computer readable medium for evaluating a sampling inspection
有权
用于评估抽样检查的方法,装置和计算机可读介质
- Patent Title: Method, apparatus, and computer readable medium for evaluating a sampling inspection
- Patent Title (中): 用于评估抽样检查的方法,装置和计算机可读介质
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Application No.: US12359194Application Date: 2009-01-23
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Publication No.: US07930123B2Publication Date: 2011-04-19
- Inventor: Takahiro Ikeda , Masafumi Asano
- Applicant: Takahiro Ikeda , Masafumi Asano
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2008-013360 20080124
- Main IPC: G01N37/00
- IPC: G01N37/00

Abstract:
A method for evaluating a sampling inspection. The method includes determining a first and a second sampling plan, and obtaining a first and a second measured value of a production lot based on the first and the second sampling plans, respectively. The method also includes calculating a first and a second acceptance variable based on the first and second measured values, respectively, and calculating a first and second acceptance probabilities based on the first and second acceptance variables, respectively. The method further includes calculating a first and a second operating characteristic of the first and second sampling plans based on the first and second acceptance probabilities, respectively, and evaluating the first and the second operating characteristics.
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