Invention Grant
US07929235B2 Method and system for distinguishing spatial and thermal defects on perpendicular media
有权
用于区分垂直介质上的空间和热缺陷的方法和系统
- Patent Title: Method and system for distinguishing spatial and thermal defects on perpendicular media
- Patent Title (中): 用于区分垂直介质上的空间和热缺陷的方法和系统
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Application No.: US12437425Application Date: 2009-05-07
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Publication No.: US07929235B2Publication Date: 2011-04-19
- Inventor: Stephen Frank Meier , David H. Ferry , Hassan Jalalian
- Applicant: Stephen Frank Meier , David H. Ferry , Hassan Jalalian
- Applicant Address: US CA Fremont
- Assignee: MRA TEK, LLC
- Current Assignee: MRA TEK, LLC
- Current Assignee Address: US CA Fremont
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G11B27/36
- IPC: G11B27/36
Abstract:
Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
Public/Granted literature
- US20090213712A1 Method and System for Distinguishing Spatial and Thermal Defects on Perpendicular Media Public/Granted day:2009-08-27
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