Invention Grant
- Patent Title: Monitoring physical operating parameters of an integrated circuit
- Patent Title (中): 监控集成电路的物理操作参数
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Application No.: US11720190Application Date: 2005-11-07
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Publication No.: US07928882B2Publication Date: 2011-04-19
- Inventor: Hendricus J M Veendrick , Marcel Pelgrom , Violeta Petrescu
- Applicant: Hendricus J M Veendrick , Marcel Pelgrom , Violeta Petrescu
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: GB0425800.0 20041124
- International Application: PCT/IB2005/053644 WO 20051107
- International Announcement: WO2006/005898 WO 20060601
- Main IPC: H03M1/12
- IPC: H03M1/12 ; H03M1/34

Abstract:
An integrated circuit comprises a plurality of sensing circuits (12), each for detecting whether a respective physical operating parameter is above or below a respective reference value. The integrated circuit contains a serial shift register (11) for shifting digital data signals that represent the respective reference values from a successive approximation update circuit (14) to the sensing circuits (12) and back to the successive approximation update circuit (14). Detection results of the sensing circuits (12) are shifted to the successive approximation update circuit (14) with the digital data signals. The successive approximation update circuit (14) is used to form the digital data so that the reference values form successive approximations of the physical operating parameter values during an analog to digital conversion process. In this way the successive approximation update circuit (14) is shared by a plurality of sensing circuits (12).
Public/Granted literature
- US20080007246A1 Monnitoring Physical Operating Parameters Of An Integrated Circuit Public/Granted day:2008-01-10
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