Invention Grant
- Patent Title: Embedded software testing using a single output
- Patent Title (中): 使用单个输出的嵌入式软件测试
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Application No.: US12130201Application Date: 2008-05-30
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Publication No.: US07904755B2Publication Date: 2011-03-08
- Inventor: Jeyur Patel
- Applicant: Jeyur Patel
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
An integrated circuit includes a processor and a circuit. The processor is configured to execute software. The software includes a plurality of software events. The circuit is configured to output a pulse on a single pin or pad of the integrated circuit in response to executing each software event. A pulse width of each pulse identifies a software event.
Public/Granted literature
- US20090300402A1 EMBEDDED SOFTWARE TESTING USING A SINGLE OUTPUT Public/Granted day:2009-12-03
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