Invention Grant
US07898086B2 Semiconductor device having a package base with at least one through electrode
有权
具有具有至少一个贯通电极的封装基底的半导体器件
- Patent Title: Semiconductor device having a package base with at least one through electrode
- Patent Title (中): 具有具有至少一个贯通电极的封装基底的半导体器件
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Application No.: US11360570Application Date: 2006-02-24
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Publication No.: US07898086B2Publication Date: 2011-03-01
- Inventor: Yoshimi Egawa
- Applicant: Yoshimi Egawa
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rabin & Berdo PC
- Priority: JP2005-053918 20050228
- Main IPC: H01L29/40
- IPC: H01L29/40

Abstract:
A through electrode extends through a silicon substrate from the upper surface to the lower surface of the substrate to accomplish electrical conduction between the upper and lower surfaces of the substrate. The through electrode includes a plurality of slender through holes formed in a through electrode forming area of the silicon substrate. The slender through holes extend through the silicon substrate from the upper surface to the lower surface of the silicon substrate. The through electrode also includes a plurality of conductive bodies fitted in the slender through holes. The conductive bodies are electrically connected with each other.
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