Invention Grant
US07886247B2 Method and apparatus for statistical path selection for at-speed testing
有权
用于速度测试的统计路径选择的方法和装置
- Patent Title: Method and apparatus for statistical path selection for at-speed testing
- Patent Title (中): 用于速度测试的统计路径选择的方法和装置
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Application No.: US12111634Application Date: 2008-04-29
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Publication No.: US07886247B2Publication Date: 2011-02-08
- Inventor: Hanif Fatemi , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
- Applicant: Hanif Fatemi , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
In one embodiment, the invention is a method and apparatus for statistical path selection for at-speed testing. One embodiment of a method for selecting a path of an integrated circuit chip for at-speed testing includes computing a process coverage metric for a plurality of paths in the integrated circuit chip and selecting at least one path that maximizes the process coverage metric.
Public/Granted literature
- US20090271751A1 METHOD AND APPARATUS FOR STATISTICAL PATH SELECTION FOR AT-SPEED TESTING Public/Granted day:2009-10-29
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