Invention Grant
US07886082B2 Extended input/output measurement word facility, and emulation of that facility
有权
扩展的输入/输出测量字设备，以及该设施的仿真
- Patent Title: Extended input/output measurement word facility, and emulation of that facility
- Patent Title (中): 扩展的输入/输出测量字设备，以及该设施的仿真
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Application No.: US11965866Application Date: 2007-12-28
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Publication No.: US07886082B2Publication Date: 2011-02-08
- Inventor: Scott M. Carlson , Greg A. Dyck , Tan Lu , Kenneth J. Oakes , Dale F. Riedy, Jr. , William J. Rooney , John S. Trotter , Leslie W. Wyman , Harry M. Yudenfriend
- Applicant: Scott M. Carlson , Greg A. Dyck , Tan Lu , Kenneth J. Oakes , Dale F. Riedy, Jr. , William J. Rooney , John S. Trotter , Leslie W. Wyman , Harry M. Yudenfriend
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent John E. Campbell
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G01R15/00
Abstract:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
Public/Granted literature
- US20080103755A1 Extended Input/Output Measurement Word Facility, and Emulation of that Facility Public/Granted day:2008-05-01
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