Invention Grant
- Patent Title: Automated noise measurement system
- Patent Title (中): 自动噪声测量系统
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Application No.: US12016188Application Date: 2008-01-17
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Publication No.: US07885632B2Publication Date: 2011-02-08
- Inventor: Todd Wangsness , Eugene Rzyski
- Applicant: Todd Wangsness , Eugene Rzyski
- Applicant Address: US CA Newport Beach
- Assignee: OmniPhase Research Laboratories, Inc.
- Current Assignee: OmniPhase Research Laboratories, Inc.
- Current Assignee Address: US CA Newport Beach
- Agency: The Eclipse Group LLP
- Main IPC: H04B1/30
- IPC: H04B1/30 ; G06F19/00
Abstract:
A noise test measurement system configured to measure a noise component of a transmitted RF signal is described. The noise test measurement system may include an antenna, a low-noise amplifier, a local oscillator, a first coupler, a first variable phase-shifter, a first mixer, and a processor.
Public/Granted literature
- US20080214129A1 AUTOMATED NOISE MEASUREMENT SYSTEM Public/Granted day:2008-09-04
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