Invention Grant
- Patent Title: Systems and methods for implant virtual review
- Patent Title (中): 植入物虚拟评估的系统和方法
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Application No.: US11548576Application Date: 2006-10-11
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Publication No.: US07885441B2Publication Date: 2011-02-08
- Inventor: Laurent Jacques Node-Langlois , Cristian Atria Cravatto
- Applicant: Laurent Jacques Node-Langlois , Cristian Atria Cravatto
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: McAndrews, Held & Malloy, Ltd.
- Agent Michael A. Dellapenna
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A61B5/05

Abstract:
Certain embodiments of the present invention provide systems and methods for virtual implant review. Certain embodiments provide a method for virtual implant review. The method includes registering a two-dimensional image and a three-dimensional image. The method includes detecting an implant or instrument in the two-dimensional image. The method also includes performing an initial implant registration of the implant or instrument with respect to the three dimensional image based on navigation information and refining the initial implant registration based on image data analysis to generate a refined implant registration. Additionally, the method includes displaying a representation of the implant or instrument with respect to the three-dimensional image based on the refined image registration and the refined implant registration.
Public/Granted literature
- US20080089566A1 SYSTEMS AND METHODS FOR IMPLANT VIRTUAL REVIEW Public/Granted day:2008-04-17
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