Invention Grant
US07885136B2 Semiconductor memory device having high stability and quality of readout operation
有权
具有高稳定性和读出操作质量的半导体存储器件
- Patent Title: Semiconductor memory device having high stability and quality of readout operation
- Patent Title (中): 具有高稳定性和读出操作质量的半导体存储器件
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Application No.: US12409731Application Date: 2009-03-24
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Publication No.: US07885136B2Publication Date: 2011-02-08
- Inventor: Katsuaki Matsui , Junichi Ogane
- Applicant: Katsuaki Matsui , Junichi Ogane
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, P.L.L.C.
- Priority: JP2008-080494 20080326
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
A semiconductor memory cell device includes a first multiplexer selecting a sub-block including a memory cell storing data to be read out in a row, a drain selector selecting a first column line connected to one terminal of the memory cell to be read, a precharge selector selecting a second column line connected to the other terminal of the memory cells adjacent to the one terminal of the memory cell storing the data to be readout, a second multiplexer selecting the sub-block including the second column line, a source selector selecting a third column line connected to the other terminal of the memory cell storing the data to be read out. The second multiplexer and precharge selector, when selecting, apply a first voltage to the second column line, and the source selector, when selecting, applies a second voltage to the third column line.
Public/Granted literature
- US20090245002A1 SEMICONDUCTOR MEMORY DEVICE HAVING HIGH STABILITY AND QUALITY OF READOUT OPERATION Public/Granted day:2009-10-01
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