Invention Grant
US07885131B2 Resistance change semiconductor memory device and method of reading data with a first and second switch circuit 有权
电阻变化半导体存储器件以及利用第一和第二开关电路读取数据的方法

Resistance change semiconductor memory device and method of reading data with a first and second switch circuit
Abstract:
A semiconductor memory device of the present invention comprises a memory array and a read circuit that reads data of a selected cell. The memory array includes a plurality of memory cells and a reference cell each having a memory element that stores data based on change in resistance value. The read circuit includes: a voltage comparison unit that compares a value corresponding to a sense current from the selected cell with a value corresponding to a reference current from the reference cell; a first switch; and a second switch. Both of the first and second switches are provided at a subsequent stage of a decoder and at a preceding stage of the voltage comparison unit. The second switch circuit controls input of the value corresponding to the sense current to the voltage comparison unit, while the first switch circuit controls input of the value corresponding to the reference current to the voltage comparison unit.
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