Invention Grant
- Patent Title: Bi-directional reflectance distribution measuring instrument
- Patent Title (中): 双向反射分布测量仪
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Application No.: US12094443Application Date: 2006-11-17
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Publication No.: US07884943B2Publication Date: 2011-02-08
- Inventor: Gerhard Bonnet
- Applicant: Gerhard Bonnet
- Applicant Address: DE Waldfischbach-Burgalben
- Assignee: Spheron VR AG
- Current Assignee: Spheron VR AG
- Current Assignee Address: DE Waldfischbach-Burgalben
- Agency: Baker & Daniels LLP
- Priority: DE102005056106 20051123
- International Application: PCT/DE2006/002017 WO 20061117
- International Announcement: WO2007/059737 WO 20070531
- Main IPC: G01N21/47
- IPC: G01N21/47

Abstract:
The invention concerns a bidirectional reflectance distribution meter having a light source which illuminates a sample using pre-determinable elevation and a light receiver, which can be moved relative to the light source in order to receive light from the sample. To this end, it has been designed that the light receiver comprises several receiver elements to collect simultaneously a broad elevation angle range, and that at least one of the light receiver element and the light source is movable around an axis that extends generally vertical to the sample.
Public/Granted literature
- US20080304070A1 Bi-Directional Reflectance Distribution Measuring Instrument Public/Granted day:2008-12-11
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