Invention Grant
- Patent Title: Electro-optical device, method of testing the same, and electronic apparatus
- Patent Title (中): 电光装置,测试方法以及电子装置
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Application No.: US11464652Application Date: 2006-08-15
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Publication No.: US07884892B2Publication Date: 2011-02-08
- Inventor: Kenya Ishii
- Applicant: Kenya Ishii
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2005-237188 20050818; JP2006-140015 20060519
- Main IPC: G02F1/1333
- IPC: G02F1/1333

Abstract:
An electro-optical device includes: a counter substrate; an element substrate comprising a protruding region protruding from one side of the counter substrate and being bonded to the counter substrate; a plurality of pixel units that are arranged in a pixel region on the element substrate; a plurality of external circuit connecting terminals which are arranged in the protruding region on the element substrate and to which various signals including image signals and control signals for allowing the plurality of pixel units to display an image are supplied; and a plurality of test terminals that are provided at both ends of an array of the plurality of external circuit connecting terminals in the protruding region and are supplied with test signals, wherein a distance between adjacent test terminals is longer than a distance between adjacent external circuit connecting terminals.
Public/Granted literature
- US20070040983A1 ELECTRO-OPTICAL DEVICE, METHOD OF TESTING THE SAME, AND ELECTRONIC APPARATUS Public/Granted day:2007-02-22
Information query
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