Invention Grant
US07884635B2 Integrated circuit, system and method including a performance test mode 有权
集成电路,系统和方法包括性能测试模式

Integrated circuit, system and method including a performance test mode
Abstract:
An integrated circuit includes N configurable cells each including one functional input, one output, one propagation input and one output. The circuit includes a functional mode in which the N configurable cells are coupled by their functional input and their output to logic blocks with which they cooperate to form at least one logic circuit. The disclosed circuit also includes a test mode in which the N configurable cells are coupled by their propagation input and their output to the logic blocks and in which the output of the Nth configurable cell is coupled to a functional input of the first logic block to form an oscillator.
Information query
Patent Agency Ranking
0/0