Invention Grant
US07884635B2 Integrated circuit, system and method including a performance test mode
有权
集成电路,系统和方法包括性能测试模式
- Patent Title: Integrated circuit, system and method including a performance test mode
- Patent Title (中): 集成电路,系统和方法包括性能测试模式
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Application No.: US12033483Application Date: 2008-02-19
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Publication No.: US07884635B2Publication Date: 2011-02-08
- Inventor: Bertrand Borot , Emmanuel Bechet
- Applicant: Bertrand Borot , Emmanuel Bechet
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics, SA
- Current Assignee: STMicroelectronics, SA
- Current Assignee Address: FR Montrouge
- Agency: Graybeal Jackson LLP
- Agent Lisa K. Jorgenson; Kevin D. Jablonski
- Priority: FR0753324 20070219
- Main IPC: H03K19/00
- IPC: H03K19/00

Abstract:
An integrated circuit includes N configurable cells each including one functional input, one output, one propagation input and one output. The circuit includes a functional mode in which the N configurable cells are coupled by their functional input and their output to logic blocks with which they cooperate to form at least one logic circuit. The disclosed circuit also includes a test mode in which the N configurable cells are coupled by their propagation input and their output to the logic blocks and in which the output of the Nth configurable cell is coupled to a functional input of the first logic block to form an oscillator.
Public/Granted literature
- US20080197876A1 INTEGRATED CIRCUIT, SYSTEM AND METHOD INCLUDING A PERFORMANCE TEST MODE Public/Granted day:2008-08-21
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