Invention Grant
- Patent Title: IC carrie, IC socket and method for testing IC device
- Patent Title (中): IC载体,IC插座和IC器件测试方法
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Application No.: US11886139Application Date: 2005-03-11
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Publication No.: US07884630B2Publication Date: 2011-02-08
- Inventor: Eichi Osato , Junichi Kasai , Kouichi Meguro , Masanori Onodera
- Applicant: Eichi Osato , Junichi Kasai , Kouichi Meguro , Masanori Onodera
- Applicant Address: JP Tokyo US CA Sunnyvale JP Aizuwakamatsu-shi
- Assignee: Micronics Japan Co., Ltd.,Spansion LLC,SPANSION Japan Limited
- Current Assignee: Micronics Japan Co., Ltd.,Spansion LLC,SPANSION Japan Limited
- Current Assignee Address: JP Tokyo US CA Sunnyvale JP Aizuwakamatsu-shi
- Agency: Holtz, Holtz, Goodman & Chick, PC
- International Application: PCT/JP2005/004286 WO 20050311
- International Announcement: WO2006/097973 WO 20060921
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An IC device (10) held on an IC carrier (24) is a double-sided electrode type BGA IC device (10) provided with bump electrodes (14) on a first surface of a package. The IC device has, on a second surface opposite the first surface, (a) a central protrusion (30), (b) a peripheral portion (32) lower than the protrusion by one step, and (c) upper electrodes (18) formed on the peripheral portion of the IC device. The IC carrier is provided with a frame (36), a cover (40), and a holding means (42). The frame forms a device reception space (38) for receiving the IC device. The cover can cover the upper electrodes while in contact with the periphery of the IC device held on the IC carrier. The holding means can hold the IC device on the IC carrier with the cover covering the upper electrodes of the IC device. The IC device can be set in an IC socket while being mounted on the IC carrier.
Public/Granted literature
- US20080191723A1 Ic Carrier, Ic Socket and Method for Testing Ic Device Public/Granted day:2008-08-14
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