Invention Grant
- Patent Title: Semiconductor device having polysilicon bit line contact
- Patent Title (中): 具有多晶硅位线接触的半导体器件
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Application No.: US12273841Application Date: 2008-11-19
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Publication No.: US07884441B2Publication Date: 2011-02-08
- Inventor: Nam Yoon Kim
- Applicant: Nam Yoon Kim
- Applicant Address: KR Seoul
- Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Saliwanchik, Lloyd & Saliwanchik
- Priority: KR10-2007-0139265 20071227
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L29/76 ; H01L29/94 ; H01L31/062 ; H01L31/113 ; H01L31/119 ; H01L27/10 ; H01L29/739

Abstract:
Provided are a semiconductor device and a method of fabricating the same. The semiconductor device includes a plurality of device isolation layers disposed in a semiconductor substrate, the device isolation layers extending in a word line direction and spaced apart from each other; a plurality of floating gate devices extending in a bit line direction perpendicular to the device isolation layer and spaced apart from each other; a source region and a drain region disposed at sides of the floating gate device; an insulation layer disposed on the floating gate device and the source region, and a polysilicon line extending in the word line direction and connected to the drain region.
Public/Granted literature
- US20090166713A1 Semiconductor Device and Method of Fabricating the Same Public/Granted day:2009-07-02
Information query
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