Invention Grant
US07884390B2 Structure and method of forming a topside contact to a backside terminal of a semiconductor device
有权
在半导体器件的背面端子上形成顶部接触的结构和方法
- Patent Title: Structure and method of forming a topside contact to a backside terminal of a semiconductor device
- Patent Title (中): 在半导体器件的背面端子上形成顶部接触的结构和方法
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Application No.: US12168348Application Date: 2008-07-07
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Publication No.: US07884390B2Publication Date: 2011-02-08
- Inventor: John T. Andrews , Hamza Yilmaz , Bruce Marchant , Ihsiu Ho
- Applicant: John T. Andrews , Hamza Yilmaz , Bruce Marchant , Ihsiu Ho
- Applicant Address: US ME South Portland
- Assignee: Fairchild Semiconductor Corporation
- Current Assignee: Fairchild Semiconductor Corporation
- Current Assignee Address: US ME South Portland
- Agency: Townsend and Townsend and Crew LLP
- Main IPC: H01L29/732
- IPC: H01L29/732

Abstract:
A vertically conducting semiconductor device includes a semiconductor substrate having a topside surface and a backside surface. The semiconductor substrate serves as a terminal of the vertically conducting device for biasing the vertically conducting device during operation. An epitaxial layer extends over the topside surface of the semiconductor substrate but terminates prior to reaching an edge of the semiconductor substrate so as to form a recessed region along a periphery of the semiconductor substrate. An interconnect layer extends into the recessed region but terminates prior to reaching an edge of the semiconductor substrate. The interconnect layer electrically contacts the topside surface of the semiconductor substrate in the recessed region to thereby provide a topside contact to the semiconductor substrate.
Public/Granted literature
- US20090173993A1 Structure and Method of Forming a Topside Contact to a Backside Terminal of a Semiconductor Device Public/Granted day:2009-07-09
Information query
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