Invention Grant
- Patent Title: Graded lithographic mask
- Patent Title (中): 分级光刻面具
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Application No.: US11873473Application Date: 2007-10-17
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Publication No.: US07883822B2Publication Date: 2011-02-08
- Inventor: Byron N. Burgess , Stuart M. Jacobsen
- Applicant: Byron N. Burgess , Stuart M. Jacobsen
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Warren L. Franz; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G03F1/00
- IPC: G03F1/00 ; C25F3/00

Abstract:
In one aspect there is provided a gray scale lithographic mask that comprises a transparent substrate and a metallic layer located over the substrate, wherein the metallic layer has tapered edges with a graded transparency. The lithographic mask, along with etching processes may be used to transfer a pattern 450a into a layer of a semiconductor device.
Public/Granted literature
- US20090104540A1 Graded lithographic mask Public/Granted day:2009-04-23
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