Invention Grant
- Patent Title: Methods and systems of determining physical characteristics associated with objects tagged with RFID tags
- Patent Title (中): 确定与RFID标签标签相关的物理特性的方法和系统
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Application No.: US11692577Application Date: 2007-03-28
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Publication No.: US07880618B2Publication Date: 2011-02-01
- Inventor: John R Tuttle
- Applicant: John R Tuttle
- Applicant Address: US NY Mt. Kisco
- Assignee: Round Rock Research, LLC
- Current Assignee: Round Rock Research, LLC
- Current Assignee Address: US NY Mt. Kisco
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Main IPC: G08B13/14
- IPC: G08B13/14

Abstract:
Methods and systems of determining physical characteristics associated with objects tagged with Radio Frequency Identification (RFID) tags. At least some of the illustrative embodiments are methods comprising receiving an electromagnetic signal transmitted by a radio frequency identification (RFID) tag coupled to an object (the receiving the electromagnetic signal in response to an interrogating signal), and determining orientation of the object based, at least in part, on the electromagnetic signal.
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