Invention Grant
US07865812B2 Apparatus and method for determining a detected punctured position in punctured convolutional codes
有权
用于确定穿孔卷积码中检测到的穿孔位置的装置和方法
- Patent Title: Apparatus and method for determining a detected punctured position in punctured convolutional codes
- Patent Title (中): 用于确定穿孔卷积码中检测到的穿孔位置的装置和方法
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Application No.: US11675664Application Date: 2007-02-16
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Publication No.: US07865812B2Publication Date: 2011-01-04
- Inventor: Ming-Luen Liou , Rong-Liang Chiou
- Applicant: Ming-Luen Liou , Rong-Liang Chiou
- Applicant Address: TW Hsin-Chu
- Assignee: Mediatek Inc.
- Current Assignee: Mediatek Inc.
- Current Assignee Address: TW Hsin-Chu
- Agency: Thomas, Kayden, Horstemeyer & Risley
- Main IPC: H03M13/35
- IPC: H03M13/35

Abstract:
An apparatus for generating a detected punctured position in punctured convolutional codes. A delay line circuit has a plurality of delay elements connected in series, storing a finite sequence of an input bit stream. A logic gate circuit, coupled to outputs of a part of the delay elements of the delay line circuit in accordance with a parity check polynomial, performs a logic operation to output a number stream. The number stream is accumulated for possible punctured positions and the one of the possible punctured positions with a minimal accumulated number is selected and determined as the detected punctured position.
Public/Granted literature
- US20080201628A1 APPARATUS AND METHOD FOR DETERMINING A DETECTED PUNCTURED POSITION IN PUNCTURED CONVOLUTIONAL CODES Public/Granted day:2008-08-21
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