Invention Grant
- Patent Title: Automated microcode detected error index generation
- Patent Title (中): 自动微码检测出错误索引生成
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Application No.: US12125799Application Date: 2008-05-22
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Publication No.: US07865783B2Publication Date: 2011-01-04
- Inventor: Matthew Charles Compton , Louis Daniel Echevarria , Ricardo Sedillos Padilla , Richard Albert Welp
- Applicant: Matthew Charles Compton , Louis Daniel Echevarria , Ricardo Sedillos Padilla , Richard Albert Welp
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Griffiths & Seaton PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A method, system and computer program product for logging and identifying microcode errors in a computing environment is provided. Each of a plurality of errors in the microcode is logged using a plurality of error logging commands. Each of the plurality of errors is indexed to generate a plurality of indexed errors. A plurality of unique keys is associated to each of the plurality of indexed errors. A master index of the plurality of unique keys is created.
Public/Granted literature
- US20090292955A1 AUTOMATED MICROCODE DETECTED ERROR INDEX GENERATION Public/Granted day:2009-11-26
Information query
