Invention Grant
- Patent Title: Method for test case generation
- Patent Title (中): 测试用例生成方法
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Application No.: US11868369Application Date: 2007-10-05
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Publication No.: US07865780B2Publication Date: 2011-01-04
- Inventor: Stefan Dipper , Peter John
- Applicant: Stefan Dipper , Peter John
- Applicant Address: DE Walldorf
- Assignee: SAP AG
- Current Assignee: SAP AG
- Current Assignee Address: DE Walldorf
- Agency: Mintz, Levin, Cohn, Ferris, Glovsky & Popeo, PC
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A system and method for providing randomly-generated test cases for a set of interfaces of a piece of software are disclosed. A test case generator is initialized with parameter arrays Sp with cardinality mp and a prime number qp. For each independent parameter p of each of the set of interfaces, a test case number t is generated. A test case is then generated based on the values for each independent parameter p and based on t and Sp, mp, and qp.
Public/Granted literature
- US20090094486A1 Method For Test Case Generation Public/Granted day:2009-04-09
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