Invention Grant
- Patent Title: Selective instruction breakpoint generation based on a count of instruction source events
- Patent Title (中): 基于指令源事件计数的选择性指令断点生成
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Application No.: US11392383Application Date: 2006-03-29
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Publication No.: US07865704B2Publication Date: 2011-01-04
- Inventor: William C. Moyer
- Applicant: William C. Moyer
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F9/44

Abstract:
A method includes generating an instruction address value in response to an instruction source event. The method further includes selectively generating a breakpoint request based on the instruction source event and responsive to a comparison of the instruction address value to a breakpoint address value. In one embodiment, selectively generating a breakpoint request includes comparing the instruction source event to an instruction source event type, comparing the instruction address value to a breakpoint address value, and generating the breakpoint request responsive to a match between the first instruction source event type and the instruction source event and a match between the instruction address value and the breakpoint address value.
Public/Granted literature
- US20070234017A1 Selective instruction breakpoint generation Public/Granted day:2007-10-04
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