Invention Grant
- Patent Title: Diagnostic test sequence optimization method and apparatus
- Patent Title (中): 诊断测试序列优化方法和装置
-
Application No.: US11452249Application Date: 2006-06-14
-
Publication No.: US07865278B2Publication Date: 2011-01-04
- Inventor: Olav M. Underdal , Harry M. Gilbert , Oleksiy Portyanko , Randy L. Mayes , Gregory J. Fountain , William W. Wittliff, III
- Applicant: Olav M. Underdal , Harry M. Gilbert , Oleksiy Portyanko , Randy L. Mayes , Gregory J. Fountain , William W. Wittliff, III
- Applicant Address: US NC Charlotte
- Assignee: SPX Corporation
- Current Assignee: SPX Corporation
- Current Assignee Address: US NC Charlotte
- Agency: Baker & Hostetler LLP
- Main IPC: G01M17/00
- IPC: G01M17/00 ; G06F7/00 ; G06F19/00

Abstract:
A diagnostic test sequence optimizer includes a diagnostic test selector that determines a group of diagnostic test procedures related to a specific symptom and vehicle type from a pool of diagnostic procedures. A failure mode analyzer then selects one or more factors that can affect resolution of a vehicle operational problem and performs a failure mode analysis to quantify a comparative utility of the individual tests, and a factor weighter assigns a weight to each of the factors. A vehicle receiver receives information regarding the history of the test subject vehicle, and a sequence optimizer places the diagnostic test procedures in an optimized sequence in accordance with the comparative utilities of the individual diagnostic procedures, user preferences and a Failure Mode and Effects Analysis compiled by the manufacturer of the vehicle.
Public/Granted literature
- US20070294000A1 Diagnostic test sequence optimization method and apparatus Public/Granted day:2007-12-20
Information query