Invention Grant
- Patent Title: On optimizing template matching via performance characterization
- Patent Title (中): 通过性能表征优化模板匹配
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Application No.: US11493311Application Date: 2006-07-26
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Publication No.: US07865019B2Publication Date: 2011-01-04
- Inventor: Tony X. Han , Visvanathan Ramesh , Ying Zhu
- Applicant: Tony X. Han , Visvanathan Ramesh , Ying Zhu
- Applicant Address: US NJ Iselin
- Assignee: Siemens Corporation
- Current Assignee: Siemens Corporation
- Current Assignee Address: US NJ Iselin
- Agent Donald B. Paschburg
- Main IPC: G06K9/62
- IPC: G06K9/62
Abstract:
The performance of template matching is characterized by deriving the distribution of warp parameter estimate as a function of the ideal template, the ideal warp parameters and a given perturbation or noise model. An expression for the Probability Mass Function of the parameter estimate is provided. The optimal template size for template matching is the one that provides the best matching performance which is calculated from the minimum entropy of the parameter estimate.
Public/Granted literature
- US20070025594A1 On optimizing template matching via performance characterization Public/Granted day:2007-02-01
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