Invention Grant
- Patent Title: Microscope system, observation method and observation program
- Patent Title (中): 显微镜系统,观察方法和观察程序
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Application No.: US11589529Application Date: 2006-10-30
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Publication No.: US07865007B2Publication Date: 2011-01-04
- Inventor: Tatsuki Yamada
- Applicant: Tatsuki Yamada
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz, Goodman & Chick, PC
- Main IPC: G06K9/20
- IPC: G06K9/20 ; G06K9/36

Abstract:
It is possible to provide a microscope system, capable of constructing a wide vision and high definition microscope image without requiring a work by a pathologist, of reducing a storage capacity for recording and storing after a pathologist observing and/or determining a diagnosis, and of forming and displaying a wide vision and high definition microscope image by comprising means for obtaining image information of the entirety, or a part, of a sample by moving an object lens and a sample relatively to each other in the perpendicular direction against an optical axis, means for designating a specific zone of the obtained image information, means for storing image information of the designated specific zone, means for reducing an information volume of image information not designated among the obtained image information, means for storing the reduced image information, and means for storing a positional relationship between these pieces of stored image information.
Public/Granted literature
- US20080100703A1 Microscope system, observation method and observation program Public/Granted day:2008-05-01
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