Invention Grant
- Patent Title: Oscillation circuit, test apparatus and electronic device
- Patent Title (中): 振荡电路,测试仪器和电子设备
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Application No.: US12136046Application Date: 2008-06-09
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Publication No.: US07863990B2Publication Date: 2011-01-04
- Inventor: Masakatsu Suda
- Applicant: Masakatsu Suda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha Liang LLP
- Priority: JP2005-367167 20051220
- Main IPC: H03K3/03
- IPC: H03K3/03

Abstract:
Provided is an oscillation circuit for generating an oscillation signal synchronized with a supplied reference clock, including: a voltage control oscillation section that, when triggered by each edge of the reference clock, stops oscillation of the oscillation signal having a frequency in accordance with a supplied control voltage to start new oscillation; a phase comparing section that compares a phase of a comparison signal that is in accordance with the oscillation signal outputted from the voltage control oscillation section and a phase of a signal that is in accordance with the reference clock; and a voltage control section that supplies the control voltage in accordance with a comparison result of the phase comparing section, to the voltage control oscillation section.
Public/Granted literature
- US20090146703A1 OSCILLATION CIRCUIT, TEST APPARATUS AND ELECTRONIC DEVICE Public/Granted day:2009-06-11
Information query
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