Invention Grant
US07863916B2 Device mounted apparatus, test head, and electronic device test system
有权
装置安装装置，试验头和电子装置试验系统
- Patent Title: Device mounted apparatus, test head, and electronic device test system
- Patent Title (中): 装置安装装置，试验头和电子装置试验系统
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Application No.: US12093976Application Date: 2005-11-17
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Publication No.: US07863916B2Publication Date: 2011-01-04
- Inventor: Koei Nishiura
- Applicant: Koei Nishiura
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein P.L.C.
- International Application: PCT/JP2005/021137 WO 20051117
- International Announcement: WO2007/057959 WO 20070524
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A device mounted apparatus includes a board on which a plurality of devices are mounted and a device cooling cover covering the plurality of devices, and formed inside it with a channel through which a refrigerant can flow. The device cooling cover includes a first cover covering only the measurement device among the plurality of devices, and a second cover covering only the power device among the plurality of devices. The first cover and the second cover are electrically insulated from each other.
Public/Granted literature
- US20090027073A1 DEVICE MOUNTED APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM Public/Granted day:2009-01-29
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