Invention Grant
- Patent Title: Enhanced resolution mass spectrometer and mass spectrometry method
- Patent Title (中): 增强分辨率质谱仪和质谱法
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Application No.: US12242110Application Date: 2008-09-30
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Publication No.: US07863556B2Publication Date: 2011-01-04
- Inventor: August Hidalgo , John Fjeldsted , William Frazer
- Applicant: August Hidalgo , John Fjeldsted , William Frazer
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: B01D59/44
- IPC: B01D59/44
Abstract:
A mass spectrum is generated by a process in which, from a mass scan signal comprising original samples defining a peak, a subset of the original samples defining the peak is selected. One or more synthesized samples are synthesized from the subset of the original samples. The one or more synthesized samples provide a temporal resolution greater than the temporal resolution of the original samples. The one or more synthesized samples are summed with respective temporally-aligned accumulated samples to produce the mass spectrum. The accumulated samples are obtained from mass scan signals generated during respective previously-performed mass scan operations.
Public/Granted literature
- US20090020697A1 Enhanced Resolution Mass Spectrometer and Mass Spectrometry Method Public/Granted day:2009-01-22
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