Invention Grant
US07863541B2 Laser annealing apparatus and semiconductor device manufacturing method
有权
激光退火装置及半导体装置的制造方法
- Patent Title: Laser annealing apparatus and semiconductor device manufacturing method
- Patent Title (中): 激光退火装置及半导体装置的制造方法
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Application No.: US10944000Application Date: 2004-09-20
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Publication No.: US07863541B2Publication Date: 2011-01-04
- Inventor: Shunpei Yamazaki , Koichiro Tanaka , Masaaki Hiroki
- Applicant: Shunpei Yamazaki , Koichiro Tanaka , Masaaki Hiroki
- Applicant Address: JP Kanagawa-Ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-Ken
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JP2001-245095 20010810
- Main IPC: B23K26/00
- IPC: B23K26/00

Abstract:
This invention is intended to provide a laser annealing method by employing a laser annealer lower in running cost so as to deal with a large-sized substrate, for preventing or decreasing the generation of a concentric pattern and to provide a semiconductor device manufacturing method including a step using the laser annealing method. While moving a substrate at a constant rate between 20 and 200 cm/s, a laser beam is radiated aslant to a semiconductor film on a surface of the semiconductor substrate. Therefore, it is possible to radiate a uniform laser beam to even a semiconductor film on a large-sized substrate and to thereby manufacture a semiconductor device for which the generation of a concentric pattern is prevented or decreased. By condensing a plurality of laser beams into one flux, it is possible to prevent or decrease the generation of a concentric pattern and to thereby improve the reliability of the semiconductor device.
Public/Granted literature
- US20050035095A1 Laser annealing apparatus and semiconductor device manufacturing method Public/Granted day:2005-02-17
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