Invention Grant
- Patent Title: Manufacturing method of semiconductor substrate and semiconductor device
- Patent Title (中): 半导体衬底和半导体器件的制造方法
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Application No.: US12155053Application Date: 2008-05-29
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Publication No.: US07863155B2Publication Date: 2011-01-04
- Inventor: Shunpei Yamazaki , Koichiro Tanaka
- Applicant: Shunpei Yamazaki , Koichiro Tanaka
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2007-146889 20070601
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
It is an object of the present invention to obtain a large-sized SOI substrate by providing a single-crystal silicon layer over a large-sized glass substrate in a large area. After a plurality of rectangular single-crystal semiconductor substrates each provided with a separation layer are aligned over a dummy substrate and both of the substrates are fixed with a low-temperature coagulant, the plurality of single-crystal semiconductor substrates are bonded to a support substrate; the temperature is raised up to a temperature, at which the low-temperature coagulant does not to have a bonding effect, so as to isolate the dummy substrate and the single-crystal semiconductor substrates; heat treatment is performed to separate part of the single-crystal semiconductor substrates, along a boundary of the respective separation layers; and single-crystal semiconductor layers are provided over the support substrate.
Public/Granted literature
- US20080299744A1 Manufacturing method of semiconductor substrate and semiconductor device Public/Granted day:2008-12-04
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