Invention Grant
US07861584B2 Probe tips for airborne instruments used to measure cloud microphysical parameters
有权
用于测量云微物理参数的机载仪器的探头技巧
- Patent Title: Probe tips for airborne instruments used to measure cloud microphysical parameters
- Patent Title (中): 用于测量云微物理参数的机载仪器的探头技巧
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Application No.: US12415314Application Date: 2009-03-31
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Publication No.: US07861584B2Publication Date: 2011-01-04
- Inventor: Alexei Korolev
- Applicant: Alexei Korolev
- Applicant Address: CA
- Assignee: Her Majesty the Queen in right of Canada, as represented by the Minister of Environment
- Current Assignee: Her Majesty the Queen in right of Canada, as represented by the Minister of Environment
- Current Assignee Address: CA
- Agency: Schmeiser, Olsen & Watts, LLP
- Main IPC: G01W1/00
- IPC: G01W1/00

Abstract:
An instrument for obtaining airborne measurements of cloud microphysical parameters. The instrument comprises supporting arms mounted thereon, optics and a detector for measuring the cloud microphysical parameters The supporting arms define an optical path of the instrument and comprise probe tips affixed thereto. The probe tips comprise an outer portion for deflecting particles away from the optical path of the instrument and an inner portion opposite the outer portion. The outer portion of the tips have a pyramidal section with a centre ridgeline and flat or concave surfaces effective to reduce water shedding and particle shattering during in-flight collection of data.
Public/Granted literature
- US20100242588A1 PROBE TIPS FOR AIRBORNE INSTRUMENTS USED TO MEASURE CLOUD MICROPHYSICAL PARAMETERS Public/Granted day:2010-09-30
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