Invention Grant
US07849444B2 Test executive with buffer overwrite detection for parameters of user-supplied code modules
有权
带有缓冲区覆盖检测的测试执行程序,用于提供用户提供的代码模块参数
- Patent Title: Test executive with buffer overwrite detection for parameters of user-supplied code modules
- Patent Title (中): 带有缓冲区覆盖检测的测试执行程序,用于提供用户提供的代码模块参数
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Application No.: US11081235Application Date: 2005-03-16
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Publication No.: US07849444B2Publication Date: 2010-12-07
- Inventor: Douglas Melamed , Scott Richardson
- Applicant: Douglas Melamed , Scott Richardson
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Jason L. Burgess
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F13/00

Abstract:
A test executive sequence may be created by including a plurality of test executive steps in the test executive sequence and configuring at least a subset of the steps to call user-supplied code modules. One or more of the user-supplied code modules may take buffer parameters. The test executive sequence may be executed on a host computer under control of a test executive engine. When executing each step in the test executive sequence that calls a user-supplied code module that takes a buffer parameter, the test executive engine may be operable to perform several operations related to detecting a situation where the user-supplied code module writes outside the bounds of the buffer parameter and/or preventing the user-supplied code module from corrupting heap data if the user-supplied code module writes outside the bounds of the buffer parameter.
Public/Granted literature
- US20060136876A1 Test executive with buffer overwrite detection for parameters of user-supplied code modules Public/Granted day:2006-06-22
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