Invention Grant
- Patent Title: Method of determining measurement uncertainties using circuit simulation
- Patent Title (中): 使用电路仿真确定测量不确定度的方法
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Application No.: US10783645Application Date: 2004-02-20
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Publication No.: US07848911B2Publication Date: 2010-12-07
- Inventor: Daniel L. Plesant
- Applicant: Daniel L. Plesant
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method of determining a measurement uncertainty of a test system uses a test system model having a plurality of uncertainty terms entered into a simulator. The test system model is run on the simulator a sufficient number of iterations while randomly varying each of a first portion of the plurality of uncertainty terms within probability distributions to produce a statistically significant number of results of a selected parameter. The results are evaluated to determine a measurement uncertainty of the selected parameter.
Public/Granted literature
- US20050187743A1 Method of determining measurment uncertainties using circuit simulation Public/Granted day:2005-08-25
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