Invention Grant
- Patent Title: Media defect removal in disk drive head testing
- Patent Title (中): 磁盘驱动器头测试中的介质缺陷删除
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Application No.: US11986234Application Date: 2007-11-19
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Publication No.: US07848037B2Publication Date: 2010-12-07
- Inventor: Youping Deng , Terry Farren , Jing Zhang
- Applicant: Youping Deng , Terry Farren , Jing Zhang
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies, Netherlands, B.V.
- Current Assignee: Hitachi Global Storage Technologies, Netherlands, B.V.
- Current Assignee Address: NL Amsterdam
- Main IPC: G11B27/36
- IPC: G11B27/36
Abstract:
A method for testing a hard disk drive is described. The method includes determining a number of defects associated with a portion of recordable media associated with a hard disk drive. The method further includes comparing the number of determined defects to a threshold number of defects and provided the number of determined defects is greater than the threshold number of defects, determining that the portion of the disk comprises disk defects.
Public/Granted literature
- US20090128142A1 Media defect removal in disk drive head testing Public/Granted day:2009-05-21
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