Invention Grant
- Patent Title: High-sensitivity method for detecting differences between the physically measurable properties of a sample and a reference
- Patent Title (中): 用于检测样品的物理可测性质与参考物之间的差异的高灵敏度方法
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Application No.: US11722757Application Date: 2005-12-21
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Publication No.: US07847930B2Publication Date: 2010-12-07
- Inventor: Ruediger Sens , Erwin Thiel
- Applicant: Ruediger Sens , Erwin Thiel
- Applicant Address: DE Ludwigshafen
- Assignee: BASF Aktiengesellschaft
- Current Assignee: BASF Aktiengesellschaft
- Current Assignee Address: DE Ludwigshafen
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: DE102004062256 20041223
- International Application: PCT/EP2005/013775 WO 20051221
- International Announcement: WO2006/069695 WO 20060706
- Main IPC: G01J1/10
- IPC: G01J1/10
Abstract:
A method for detecting differences between physically measurable properties of a sample and a reference sample. A two-dimensional reference field is generated and first and second two-dimensional patterns are produced respectively from the reference sample and the sample. A correction is made to sample response functions to eliminate time-dependent and location-dependent fluctuations of the detector.
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