Invention Grant
- Patent Title: Testing micromirror devices
- Patent Title (中): 测试微镜设备
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Application No.: US11962909Application Date: 2007-12-21
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Publication No.: US07847538B2Publication Date: 2010-12-07
- Inventor: Paul Gerald Barker
- Applicant: Paul Gerald Barker
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Charles A. Brill; Wade James Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
An array of individually addressable micromirrors is characterized by sending a driving signal to a pixel group having a fewer number of micromirrors. A response of the micromirrors in the group is measured; and the micromirror array is characterized based upon at least the measured response.
Public/Granted literature
- US20080157801A1 CHARACTERIZATION OF MICROMIRROR DEVICES USING RESET DRIVERS Public/Granted day:2008-07-03
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