Invention Grant
- Patent Title: Parallel test system
- Patent Title (中): 并行测试系统
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Application No.: US11831803Application Date: 2007-07-31
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Publication No.: US07810001B2Publication Date: 2010-10-05
- Inventor: Xiaoqing Zhou , Jason Andrew Miller
- Applicant: Xiaoqing Zhou , Jason Andrew Miller
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Yingsheng Tung; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A method and a system for defining groups of tests that may be concurrently performed or overlapped are provided. Channel-independent test groups are determined such that each group includes tests that the input/output channels may be utilized simultaneously without conflicts. The channel-independent test groups are divided into block-under-test (BUT) conflict test groups and total-independence test groups. The total-independence test groups may be performed concurrently. Performance of the BUT-conflict test groups may be overlapped such that the input/output channels are used concurrently, but the execution of the tests by the blocks of the device-under-test (DUT) is performed sequentially.
Public/Granted literature
- US20090037132A1 Parallel Test System Public/Granted day:2009-02-05
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