Invention Grant
- Patent Title: Device and method for malfunction monitoring and control
- Patent Title (中): 故障监控与控制装置及方法
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Application No.: US11161229Application Date: 2005-07-27
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Publication No.: US07809992B2Publication Date: 2010-10-05
- Inventor: Ara Kulidjian , Valeri L. Kirischian , Thomas D. Perry
- Applicant: Ara Kulidjian , Valeri L. Kirischian , Thomas D. Perry
- Applicant Address: CA Markham, Ontario
- Assignee: ATI Technologies ULC
- Current Assignee: ATI Technologies ULC
- Current Assignee Address: CA Markham, Ontario
- Agency: Vedder Price P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A monitoring device and method are provided to monitor a separate device for malfunctions and to control and restore the malfunctioning monitored device to a normal functioning state. A malfunction state includes the monitored device being powered off or in a standby power state. The monitoring device includes control logic operative to determine a malfunction state of the monitored device and to control a reapplication of power to the monitored device to reboot the monitored device based on the determined malfunction state of the monitored device. The method for monitoring and controlling the monitored device comprises the steps of: determining a malfunction state of the monitored device; and controlling a reapplication of power to the monitored device to reboot the monitored device based on the determined malfunction state of the monitored device.
Public/Granted literature
- US20070028148A1 DEVICE AND METHOD FOR MALFUNCTION MONITORING AND CONTROL Public/Granted day:2007-02-01
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