Invention Grant
- Patent Title: System and method for automatically calibrating a temperature sensor
- Patent Title (中): 自动校准温度传感器的系统和方法
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Application No.: US11183684Application Date: 2005-07-18
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Publication No.: US07809519B2Publication Date: 2010-10-05
- Inventor: Manoj Sinha , Sujeet Ayyapureddi , Brandon Roth
- Applicant: Manoj Sinha , Sujeet Ayyapureddi , Brandon Roth
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder
- Main IPC: G01K15/00
- IPC: G01K15/00

Abstract:
There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system made up of a temperature sensor which includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.
Public/Granted literature
- US20070014329A1 System and method for automatically calibrating a temperature sensor Public/Granted day:2007-01-18
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