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US07808845B2 Methods and systems to write to soft error upset tolerant latches 有权
写入软错误不耐受锁存器的方法和系统

Methods and systems to write to soft error upset tolerant latches
Abstract:
Methods and systems to write to redundant storage latches, or storage cells, including soft error upset tolerant latches and feedback-interlocked redundant storage cells, including to write a logic value to one of a plurality of same sense storage nodes, and to write a complementary logic value to a selected one of a plurality of opposite sense storage nodes responsive to the logic value. Remaining storage nodes may be written to through circuitry within the storage cell. Logic values may be output substantially simultaneously with corresponding write operations. A system may include a multiple logic level write circuit to write to the first same sense storage node, and first and second single logic level write circuits to write to the first and second opposite sense storage nodes, respectively.
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