Invention Grant
- Patent Title: Analysis system for analyzing a sample on an analytical test element
- Patent Title (中): 分析测试元素分析系统
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Application No.: US11963801Application Date: 2007-12-22
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Publication No.: US07808645B2Publication Date: 2010-10-05
- Inventor: Jochen Schulat , Klaus-Dieter Steeg
- Applicant: Jochen Schulat , Klaus-Dieter Steeg
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee Address: US IN Indianapolis
- Agency: Bose McKinney & Evans LLP
- Priority: EP05013452 20050622
- Main IPC: G01N21/47
- IPC: G01N21/47
Abstract:
The invention relates to an analysis system for analysing a sample on an analytical test element. The analysis system comprises a measuring module for carrying out measurements on the sample on the analytical test element and an optical module which comprises a lens and a diaphragm by which the light can be focused. The lens and the diaphragm of the optical module are combined as one piece in a multi-component injection-molded part.
Public/Granted literature
- US20080144022A1 ANALYSIS SYSTEM FOR ANALYZING A SAMPLE ON AN ANALYTICAL TEST ELEMENT Public/Granted day:2008-06-19
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