Invention Grant
US07808026B2 Dry etching method and production method of magnetic memory device
有权
磁记忆装置的干蚀刻方法及其制作方法
- Patent Title: Dry etching method and production method of magnetic memory device
- Patent Title (中): 磁记忆装置的干蚀刻方法及其制作方法
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Application No.: US12153848Application Date: 2008-05-27
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Publication No.: US07808026B2Publication Date: 2010-10-05
- Inventor: Toshiaki Shiraiwa , Tetsuya Tatsumi , Seiji Samukawa
- Applicant: Toshiaki Shiraiwa , Tetsuya Tatsumi , Seiji Samukawa
- Applicant Address: JP Tokyo JP Miyagi
- Assignee: Sony Corporation,Seiji Samukawa
- Current Assignee: Sony Corporation,Seiji Samukawa
- Current Assignee Address: JP Tokyo JP Miyagi
- Agency: Rader, Fishman & Grauer PLLC
- Priority: JP2003-303410 20030827
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/94 ; H01L31/062 ; H01L31/113 ; H01L31/119

Abstract:
Provision of a process capable of preferably etching particularly PtMn used for a pin layer of an MRAM is an object: a dry etching method for performing dry etching on a layer including platinum and/or manganese by using pulse plasma and a production method of an MRAM, wherein the dry etching method is applied to processing of the pin layer. The MRAM is configured to have a memory portion comprising a magnetic memory element composed of tunnel magnetoresistive effect element formed by stacking a magnetic fixed layer having a fixed magnetization direction, a tunnel barrier layer and a magnetic layer capable of changing the magnetization direction.
Public/Granted literature
- US20080286883A1 Dry etching method and production method of magnetic memory device Public/Granted day:2008-11-20
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