Invention Grant
- Patent Title: Test cells for semiconductor yield improvement
- Patent Title (中): 测试电池用于半导体产量提高
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Application No.: US12002094Application Date: 2007-12-14
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Publication No.: US07807480B2Publication Date: 2010-10-05
- Inventor: Brian Stine , Victor Kitch , Mark Zwald , Stefano Tonello
- Applicant: Brian Stine , Victor Kitch , Mark Zwald , Stefano Tonello
- Applicant Address: US CA San Jose
- Assignee: PDF Solutions, Inc.
- Current Assignee: PDF Solutions, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Cantor Colburn LLP
- Main IPC: H01L21/66
- IPC: H01L21/66

Abstract:
A test cell for localizing defects includes a first active region, a second active region formed substantially parallel to the first active region, a third active region formed substantially parallel to the first and second active regions, a fourth active region formed between the first and second active regions, and a fifth active region formed between the second and third active regions. The fourth and fifth active regions are formed adjacent to opposite end portions of the second active region. The fourth and fifth active regions are also formed substantially perpendicular to the second active region.
Public/Granted literature
- US20080169466A1 Test Cells for semiconductor yield improvement Public/Granted day:2008-07-17
Information query
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