Invention Grant
- Patent Title: Magnetoresistive random access memory
- Patent Title (中): 磁阻随机存取存储器
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Application No.: US12164410Application Date: 2008-06-30
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Publication No.: US07791930B2Publication Date: 2010-09-07
- Inventor: Yoshihiro Ueda
- Applicant: Yoshihiro Ueda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-175564 20070703
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C5/08 ; G11C11/14

Abstract:
A MRAM includes a first magnetoresistive effect (MR) element that takes a low and high resistance states. A second MR element is fixed to a low or high resistance state. First and second MOSFETs are connected to the first and second MR elements, respectively. A sense amplifier amplifies a difference between values of current flowing through the first and second MOSFETs. A current circuit outputs reference current whose value lies between current flowing through the first MR element of the low and high resistance states. A third MOSFET has one end that receives the reference current and is connected to its own gate terminal. The gate terminal of the second MOSFET receives the same potential as the gate terminal of the third MOSFET. A first resistance element is connected to the others end of the third MOSFET and has the same resistance as the second magnetoresistive effect element.
Public/Granted literature
- US20090010045A1 MAGNETORESISTIVE RANDOM ACCESS MEMORY Public/Granted day:2009-01-08
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