Invention Grant
US07791812B2 Two-element fθ lens used for micro-electro mechanical system (MEMS) laser scanning unit
失效
双元素 用于微机电系统(MEMS)激光扫描单元的透镜
- Patent Title: Two-element fθ lens used for micro-electro mechanical system (MEMS) laser scanning unit
- Patent Title (中): 双元素 用于微机电系统(MEMS)激光扫描单元的透镜
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Application No.: US12424378Application Date: 2009-04-15
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Publication No.: US07791812B2Publication Date: 2010-09-07
- Inventor: Bo-Yuan Shih , San-Woei Shyu
- Applicant: Bo-Yuan Shih , San-Woei Shyu
- Applicant Address: TW Taipei
- Assignee: E-Pin Optical Industry Co., Ltd.
- Current Assignee: E-Pin Optical Industry Co., Ltd.
- Current Assignee Address: TW Taipei
- Agency: WPAT, P.C.
- Agent Anthony King
- Priority: TW97129669A 20080805
- Main IPC: G02B26/08
- IPC: G02B26/08 ; G02B3/00 ; G02B9/00

Abstract:
A two-element f-θ lens used for a micro-electro mechanical system (MEMS) laser scanning unit includes a first lens and a second lens, the first lens is a meniscus lens of which the concave surface is disposed on a side of a MEMS mirror, the second lens is a biconcave lens, at least one optical surface is an Aspherical surface in both main scanning direction and sub scanning direction, and satisfies special optical conditions. The two-element f-θ lens corrects the nonlinear relationship between scanned angle and the time into the linear relationship between the image spot distances and the time. Meanwhile, the two-element f-θ lens focuses the scan light to the target in the main scanning and sun scanning directions, such that the purpose of the scanning linearity effect and the high resolution scanning can be achieved.
Public/Granted literature
- US20100033795A1 TWO-ELEMENT F-THETA LENS USED FOR MICRO-ELECTRO MECHANICAL SYSTEM (MEMS) LASER SCANNING UNIT Public/Granted day:2010-02-11
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