Invention Grant
- Patent Title: Attenuated total reflection probe and spectrometer therewith
- Patent Title (中): 衰减全反射探头和光谱仪
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Application No.: US12073532Application Date: 2008-03-06
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Publication No.: US07791729B2Publication Date: 2010-09-07
- Inventor: Noboru Higashi , Yukihiro Ozaki , Akifumi Ikehata
- Applicant: Noboru Higashi , Yukihiro Ozaki , Akifumi Ikehata
- Applicant Address: JP Okayama
- Assignee: Kurashiki Boseki Kabushiki Kaisha
- Current Assignee: Kurashiki Boseki Kabushiki Kaisha
- Current Assignee Address: JP Okayama
- Agency: Birch Stewart Kolasch & Birch, LLP
- Priority: JPP2007-058895 20070308
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
An attenuated total reflection probe has a prism and a supporter. The prism is made of an optical material which transmits light in far ultraviolet region, and has a contact plane to be in contact with a sample, and an incoming plane and an outgoing plane both not to be in contact with the sample. The supporter has an opening and is connected hermetically with the prism around the opening and eventually exposes the contact plane facing the opening. The contact plane, the incoming plane and the outgoing plane of the prism are formed such that light transmitting the incoming plane enters the contact plane at an incident angle larger than critical angle and that the light totally reflected by the contact plane goes out through the outgoing plane.
Public/Granted literature
- US20080218734A1 Attenuated total reflection probe and spectrometer therewith Public/Granted day:2008-09-11
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