Invention Grant
US07769565B2 Sample measurement device, measurement information display method, and computer system
有权
样品测量装置,测量信息显示方法和计算机系统
- Patent Title: Sample measurement device, measurement information display method, and computer system
- Patent Title (中): 样品测量装置,测量信息显示方法和计算机系统
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Application No.: US11895449Application Date: 2007-08-24
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Publication No.: US07769565B2Publication Date: 2010-08-03
- Inventor: Kyozo Fujita , Hiroyuki Fujino , Yoshihiro Mishima
- Applicant: Kyozo Fujita , Hiroyuki Fujino , Yoshihiro Mishima
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2006-229914 20060825
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/40

Abstract:
A measurement information display method includes: generating measurement information of a sample according to progress of measurement of the sample by a measurement unit for measuring the sample, and accumulating the measurement information in a storage part, the measurement information including state information indicating a state of the measurement by the measurement unit; accepting extracting information including an extracting condition regarding the state of measurement of the sample used in extracting the accumulated measurement information, and storing the extracting information in a memory; accepting a selection of the extracting information stored in the memory; extracting the measurement information from the accumulated measurement information according to the selected extracting information; and displaying the extracted measurement information.
Public/Granted literature
- US20080071503A1 Sample measurement device, measurement information display method, and computer system Public/Granted day:2008-03-20
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