Invention Grant
- Patent Title: Surface defect inspector and method of inspecting surface defect
- Patent Title (中): 表面缺陷检查员和检查表面缺陷的方法
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Application No.: US11655212Application Date: 2007-01-19
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Publication No.: US07769223B2Publication Date: 2010-08-03
- Inventor: Hiroaki Shinohara , Minoru Matsuura
- Applicant: Hiroaki Shinohara , Minoru Matsuura
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-010860 20060119
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Wrinkles on polymer film as surface defect are inspected. The film is transported on an inspecting surface having a color for absorbing light. A dot pattern having dots on a transparent test chart sheet, facing the film, is photographed by image pickup upon reflection of the dot pattern on the film positioned on the inspecting surface. A length of the dots being photographed is measured according to image data, to obtain length information of 1-5. A length data table of the dots is created by arranging the length information of 1-5 at locations of the dots. Occurrence of a wrinkle is determined at one of the locations if a difference between the dots occurs in the length information of 1-5 in the length data table. To a rear of the test chart sheet, inspecting light is applied, passes through, and becomes incident upon the film.
Public/Granted literature
- US20070165941A1 Surface defect inspector and method of inspecting surface defect Public/Granted day:2007-07-19
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